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Space Mapping Technique for Design Optimization: K g8 ~" u# p- i
of Antireflection Coatings in Photonic Devices
. n$ \1 V: b1 Z `% a0 s fNing-Ning Feng, Gui-Rong Zhou, and Wei-Ping Huang, Senior Member, IEEE, Member, OSA! ?, c6 |! g; }* u6 `. H n0 e
Abstract—Space-mapping (SM) technique is applied for design
4 s" W* A4 J6 ~: P+ X: aoptimization of antireflection (AR) coatings for photonic devices% [9 n5 S( C @4 B+ X1 J+ d) }3 @
such as the semiconductor optical amplifiers (SOA). The approximate' m( t* J# g% K0 W. J* ~
and efficient transfer matrix method (TMM) serves as the
" o8 H# o9 L8 C& C, Q3 ucoarse model for design optimization, whereas the time-intensive k# l# j0 a0 Y' M
and accurate finite-difference time-domain (FDTD) method is
* R" g( v F7 `used as the fine model for model calibration. A mapping is established
' w T( O1 a4 j' o$ Sbetween the parameter spaces of the coarse and the fine; F4 b* [7 B1 ^* u
models so that the fine model design becomes the inverse mapping
0 \3 f( D F% e, hof the optimized coarse model design. Remarkable performance
1 s" q% T u# S, z) h" e7 E" y9 yof the SM technique in terms of efficiency and accuracy in the- s' r+ C, ?! ?, n3 C
design optimization is demonstrated by way of examples. It is. u; x; w1 t) z1 K. i6 |
shown that, in the context of multilayer coating design, the desired
% U: }8 h2 j3 m) S1 Ubroadband ultralow reflectivities can be obtained within three fine
% @ Z3 x) }) i: ~& Hmodel (FDTD) calculations.* V" r+ a4 m% n! x& L7 |
Index Terms—Antireflection coatings, finite difference time domain
- c ?3 E. q# J; W5 s; {method, space mapping technique.
& ^- n9 b, l, E' u B, v8 n+ u, [9 `1 j$ b" b
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