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CCD Image Sensors in Deep-Ultraviolet
- Q) L$ {- [6 ?8 b图片: 6 Y9 s0 o3 N* t6 x% j
' `' ^& i6 i2 C# M5 H
; ?# N% K+ n2 T: j, M, K, Z( SCCD Image Sensors in Deep-Ultraviolet: Degradation Behavior and Damage Mechanisms (Microtechnology and MEMS) - B- a- i0 \4 U
by Flora Li and Arokia Nathan2 q' |5 Q% t H3 S% p) ~6 z
Hardcover: 231 pages
( n. p0 U9 i4 ~. o' w6 r/ u" @Publisher: Springer; 1 edition (April 19, 2005) 7 C- r/ t& A# |, \/ S
Language: English * x N. ?; ?: u+ @! q
ISBN-10: 354022680X
' o8 |' e1 }+ P. `ISBN-13: 97835402268024 E4 B4 D8 \0 {( K
Product Description
- Y- v( M& N% HIn order to facilitate the inspection of deep sub-micron features in integrated circuits, a new generation of semiconductor inspection systems is being pushed to new limits to image at ever shorter wavelengths - using deep-UV (DUV) sensitive cameras. However, conventional CCD cameras have very poor responsivity in the DUV and their stability upon prolonged DUV exposure is a relevant concern. This book investigates the causes of CCD degradation and the damage mechanisms due to DUV exposure, as well as reporting new results for device performance at these wavelengths.5 ^5 V4 N! v+ z N) W& Y# K8 ?
http://www.filesonic.com/file/22379257/354022680X.rar |
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