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CCD Image Sensors in Deep-Ultraviolet
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CCD Image Sensors in Deep-Ultraviolet: Degradation Behavior and Damage Mechanisms (Microtechnology and MEMS)
* a% s! o9 n, x; y- s* R7 r& B& _by Flora Li and Arokia Nathan; f" A$ K: R0 q" u3 k* \& b# |
Hardcover: 231 pages
7 e3 g; j8 X$ t/ G- I- Y R4 EPublisher: Springer; 1 edition (April 19, 2005)
, m3 g+ _" l0 c& E; h8 L( LLanguage: English , m Y% Z- d; ]* q( y4 _1 m' x
ISBN-10: 354022680X . U1 o: D0 e+ J3 N# s. A4 R6 @
ISBN-13: 9783540226802
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3 J1 Q3 m, E) P8 D5 G" [1 t3 Y3 x* AIn order to facilitate the inspection of deep sub-micron features in integrated circuits, a new generation of semiconductor inspection systems is being pushed to new limits to image at ever shorter wavelengths - using deep-UV (DUV) sensitive cameras. However, conventional CCD cameras have very poor responsivity in the DUV and their stability upon prolonged DUV exposure is a relevant concern. This book investigates the causes of CCD degradation and the damage mechanisms due to DUV exposure, as well as reporting new results for device performance at these wavelengths.- L6 d# W" ?9 Y2 i+ y0 f
http://www.filesonic.com/file/22379257/354022680X.rar |
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