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Ion Assisted Deposition (lAD)

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发表于 2010-5-21 21:40:09 | 显示全部楼层 |阅读模式
Ion Assisted Deposition (lAD); l6 r; x" ?- t  k! I  {
1. Why IAD?
; h& b5 x# V2 ?% H3 f4 V. {During reactive evaporation, e.g. for optical applications, energy has to be introduced into the
" d! W: J  C$ j/ I5 V, xgrowing film, otherwise it will not adhere well to the substrate, will not be dense and will not be
* Q7 @- }+ f8 j/ j: M& Scompletely oxidized. In case of conventional evaporation processes this energy is introduced by0 b+ S6 a3 }- g2 e
heating the substrate while the film is growing. The necessary temperatures are typically in the( e" p* C: |% x% O
range of 250 °C – 300 °C. In case of IAD, the energy is introduced by energetic ions from a
& V$ [% S% w# E, l/ m1 B- E: osuitable ion source and substrate temperatures can be reduced, in many cases to ambient
3 K- y3 s& [: U$ B3 o6 }3 Ztemperatures. The ion source typically produces both ions and electronically excited molecules! x3 \4 m( p: `+ B9 Y
(radicals). The respective influences of the two species can approximately be described as
+ n8 i, T; T1 e0 P& {$ v' gfollows:
% |" M) V7 u3 N$ M, cEnergetic ions (mechanical influence):
9 e  u" _$ M8 f+ j9 j0 S• Cleaning of the substrate surface, removing mainly water and hydrocarbons
1 C$ Z7 J% \( k0 L3 P& U0 q/ a• Densification of the growing film.! Q' h% G7 V) j+ `: u2 E
• Removal of loosely bound molecules during film growth.. q+ B# e' h+ V& ~/ ~* G+ A* u
Radicals (chemical influence):* q* P6 e8 ]1 w% U
• Increases reactivity of the reactive gas, better control of film stoichiometry
: r) X1 S$ Y" M' ~; }, D9 @2 j• Allows for higher deposition (growth) rates.
( O4 O# i4 f8 D* h3 @: X. oThese advantages are preconditions to achieve films of good quality with reactive coating% ^! e+ p2 ^4 A
processes at room temperature. Nevertheless, they also help to broaden the accessible parameter/ ^1 H6 ], P5 q4 h8 h
range in case of processes at elevated temperatures.6 |& R2 F+ J0 h  E7 y
2. Ion source requirements for IAD processes
6 Q& ]) P! M# u/ f2 C$ T" A. VIon sources used for IAD processes typically have to fulfill the following requirements:
9 i# K/ @$ i0 H. x: ~: w• Compatibility with reactive gases, particularly Oxygen and Nitrogen/ r' y6 b, ~" q, d: h1 r
• Sufficient ion current density to make dense moisture stable films.
: [3 D- j7 K. N8 r1 s• Adjustable to allow for control over a wide range of chamber conditions (pumping speed, chamber
; _  t2 r" o  k# G6 osize). Also, some users will want high currents at low voltages (100ev - 200ev) while others will want
  W) C8 v1 r% d' _higher energies up to 1000 ev and possibly lower currents.
0 N6 q6 Z7 h0 U& {+ b3 K7 [• Reliability, since the ion sources are primarily used in production systems.
. L4 ~$ I1 ^0 C; D! M9 A& G• Long cleaning and maintenance cycles with simple ignition and switch-off.
6 S) n6 }0 k% Z9 NWhen retrofitting an ion source to an existing coating chamber two additional requirements
0 X/ Y7 T9 O+ v% e& ~1 Q3 _become important:# U4 w  K6 ~. h# m
• Simple integration of the power supplies into the system controls. h* `- @7 |8 d: g) B$ o- @
• Compact dimensions, since space is sometimes limited in existing coating chambers.$ R8 j; W" H5 o/ \2 m
DENTON VACUUM, INC. 1259 NORTH CHURCH STREET, MOORESTOWN, NJ 08057 USA (Ph 609-439-9100, Fax 609-439-9111)

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发表于 2010-5-21 23:03:49 | 显示全部楼层
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