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[转贴] Handbook of Analytical Methods for Materials

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发表于 2009-2-24 01:10:57 | 显示全部楼层 |阅读模式
Handbook of Analytical Methods for Materials6 O$ k; z9 l! {1 {# |7 }
Contents ( z7 q' a9 ^0 B; f* Q8 T" \: u

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; x, Q5 i2 H4 }* NMATERIALS LABORATORY METHODS
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0 J' b( @( M' b: p' m) U* j2 lScanning Electron Microscopy (SEM) 5 A' l2 t$ i6 R( ^1 a
Energy Dispersive X-Ray Spectroscopy(EDS)   l: z% Q% w; r1 T: t1 m. b8 n
Atomic Force Microscopy (AFM) % N6 B8 S& I/ R
Metallographic Evaluation
5 X2 Q7 h3 D* \: Y6 @+ eMicrohardness Testing
7 s: A: i7 z3 n2 y& V0 }Nanoindentation Hardness Testing
' V2 r$ f$ k1 S% {3 sRockwell Hardness Testing 0 M6 C& N* O' d2 M- \4 W: f
Variable Pressure SEM
) s3 X* d4 E5 Q4 cLight Microscopy
7 r; o4 t3 `0 J2 L+ ]+ SPrecision Microsectioning
8 R; N8 y- W4 z) X$ ]Corrosion Testing
: R% f1 E: N; u- A9 WMechanical Testing % O: B/ G) v7 U4 y1 I7 {+ R
Chemical Analysis 7 \$ X- n+ b( A! h$ _

! u0 P# I; K# ~) }ANALYTICAL LABORATORY METHODS
% \$ {( E7 q6 V# C, N" r- RAuger Electron Spectroscopy (AES or SAM)
0 G( n9 T0 {) g5 S  f. [- DX-Ray Photoelectron Spectroscopy (XPS or ESCA) ; p) d8 {& u7 D! |' u4 A
Secondary Ion Mass Spectroscopy (SIMS)
8 K+ X5 C  G% y8 NFourier Transform Infrared Spectroscopy (FTIR)
1 e; ]/ C2 E; n5 q9 _Ion Chromatography (IC)
9 S% f. b2 J8 u6 Y; _3 MGas Chromatography (GC)
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" c7 T9 }7 s! p+ ?( j( V下载连接:http://g.zhubajie.com/urllink.php?id=1997515fhohirgmhqoqyk3i
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