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"Times New Roman";mso-bidi-font-weight:bold">本文针对薄膜的结构性能特点,集中探讨了薄膜屈服强度与微结构,薄膜力学性能与功能性,薄膜力学性能测试与表征等科学问题。通过对几种膜基体系的研究,从理论上证明薄膜屈服强度高于相应的整体材料,且随膜厚或晶粒尺寸的倒数成线性增加。指出薄膜中的正常晶粒生长存在膜厚效应,薄膜的择优取向取决于表面能、界面能和应变能之和。认为薄膜电阻率与残余应力存在对应关系。首次提出了薄膜划擦临界载荷的物理表征以及划擦实验卸载剥落抗力评价指标,并计算了薄膜的断裂韧性。</span><span lang="EN-US" style="mso-bidi-font-size:10.5pt;mso-bidi-font-weight:bold"><o:p>, x. B# p' ]* I) y4 h+ p1 z
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<p class="MsoNormal" style="line-height:150%"><b><span lang="EN-US" style="mso-bidi-font-size:10.5pt"><font size="2">Abstract<o:p>) D! p+ b$ h% G, b W0 X
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薄膜材料和薄膜器件日益广泛的应用及其可靠性指标体系的日益健全,要求学术界对其结构和性能的特殊性给出科学解释,相应的参照物除通常的块体材料外,也包括无约束的自由态薄膜。事实上,附着于基底材料表面的薄膜与无支撑的自由态薄膜其结构和性能存在很大差异,研究中除应注重低维材料相对巨大的表面效应外,多数情况下尚须考虑基底的约束效应和界面效应。本文结合课题组近几年的研究工作,着重介绍薄膜表面形貌、晶体取向、内应力、屈服强度以及薄膜与基底结合强度等方面的研究进展。</span><span lang="EN-US" style="mso-bidi-font-size:10.5pt;mso-bidi-font-weight:bold"><o:p>
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6 p6 Y# @. R9 X: q' `2 R1 umso-hansi-font-family:"Times New Roman";mso-bidi-font-weight:bold">薄膜材料由于厚度的超薄性,表面形貌的表征和影响不容忽视。研究发现,薄膜的表面形貌与真空沉积的热力学条件和动力学过程密切相关,可在一定程度上反映薄膜的形成机制和主控参量的变化</span><span lang="EN-US" style="mso-bidi-font-size:10.5pt;mso-bidi-font-weight:bold">.<o:p>6 u; C: u! Y* ?" \ }
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由于制备方式的特殊性,多晶薄膜均存在不同程度的晶体择优取向。有趣的是,对于确定的基底材料,薄膜的这种择优取向主要决定于沉积方式,工艺参数一般只能改变取向的强弱;更为有趣的是,充分退火后,脱离基底的自由态薄膜按能量最小的晶体密排面确定取向,但有支撑的附着膜却可能存在各异的晶体取向。分析认为,基底的约束作用及由此产生的薄膜应变是导致“奇异性”取向的主要原因。</span><span lang="EN-US" style="mso-bidi-font-size:10.5pt;mso-bidi-font-weight:bold"><o:p>: U. a7 u: i+ Q, ~' Q( M
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