Space Mapping Technique for Design Optimization

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Space Mapping Technique for Design Optimization
of Antireflection Coatings in Photonic Devices
' J% k" ^( h/ h( U% eNing-Ning Feng, Gui-Rong Zhou, and Wei-Ping Huang, Senior Member, IEEE, Member, OSA
Abstract—Space-mapping (SM) technique is applied for design
  S1 k- B7 a. l% Qoptimization of antireflection (AR) coatings for photonic devices
; V2 B( m- z) W+ k) m% p- Dsuch as the semiconductor optical amplifiers (SOA). The approximate
, r' @5 I' z' Q+ E4 d, `& Aand efficient transfer matrix method (TMM) serves as the
( @5 f& ~3 f; x) m  hcoarse model for design optimization, whereas the time-intensive
3 r% W# F1 M% `/ b$ r% }and accurate finite-difference time-domain (FDTD) method is
used as the fine model for model calibration. A mapping is established
; }* f8 y0 m% Z( fbetween the parameter spaces of the coarse and the fine
$ }* i) T+ f9 wmodels so that the fine model design becomes the inverse mapping
of the optimized coarse model design. Remarkable performance
of the SM technique in terms of efficiency and accuracy in the
design optimization is demonstrated by way of examples. It is
shown that, in the context of multilayer coating design, the desired
+ s1 [1 T' U+ X* Wbroadband ultralow reflectivities can be obtained within three fine
# Q! R4 `: ?6 \: G6 F/ ?5 V6 `model (FDTD) calculations.
" r/ g# X6 z4 q/ ]Index Terms—Antireflection coatings, finite difference time domain
method, space mapping technique.
* S* g8 D% t' _

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