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Ion Assisted Deposition (lAD)

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发表于 2010-5-21 21:40:09 | 显示全部楼层 |阅读模式
Ion Assisted Deposition (lAD)# \9 F; M( Z4 ^" Z
1. Why IAD?
+ b; M2 z% o" `3 u8 m* F$ v; @During reactive evaporation, e.g. for optical applications, energy has to be introduced into the
" w; J+ `( q- a7 a* Cgrowing film, otherwise it will not adhere well to the substrate, will not be dense and will not be% H* C) {! i! c6 e% B- F& k: m
completely oxidized. In case of conventional evaporation processes this energy is introduced by2 z# G& J. D8 p5 j# F7 a( {
heating the substrate while the film is growing. The necessary temperatures are typically in the
  U9 s4 W; \* z8 r) H7 `1 K: yrange of 250 °C – 300 °C. In case of IAD, the energy is introduced by energetic ions from a
# [6 Z# `# o$ f" Y/ A, ksuitable ion source and substrate temperatures can be reduced, in many cases to ambient: U) x! L! R' Z/ E. ^7 U8 ?2 g# N
temperatures. The ion source typically produces both ions and electronically excited molecules6 B: V  o! C4 g% c9 _
(radicals). The respective influences of the two species can approximately be described as5 v& ?5 {8 ]" u' d2 g+ I: Z, T
follows:
* Z! U/ t) h- b$ lEnergetic ions (mechanical influence):
; v7 n) c& b5 h& H3 `6 G• Cleaning of the substrate surface, removing mainly water and hydrocarbons; O4 T4 a' i$ \/ _  t# r
• Densification of the growing film.. Z/ q% o) S- [7 I- d* v7 {; Z
• Removal of loosely bound molecules during film growth.: i0 a4 W6 o6 ~8 K  Y: z" m
Radicals (chemical influence):% m; `2 Z) }& v. J' q3 i+ n
• Increases reactivity of the reactive gas, better control of film stoichiometry
7 c; F& x' e4 W* X8 ~! Z4 \: K3 u• Allows for higher deposition (growth) rates.
+ K3 w; T3 L4 h+ L/ t# X8 E* |These advantages are preconditions to achieve films of good quality with reactive coating
2 S9 y. H5 u2 K2 a" C, M3 J* `' oprocesses at room temperature. Nevertheless, they also help to broaden the accessible parameter/ ^9 P  T3 c7 r  h! R
range in case of processes at elevated temperatures.
$ w7 L. U7 C2 {% P& O2. Ion source requirements for IAD processes
- |( C, n# U  a: ~( GIon sources used for IAD processes typically have to fulfill the following requirements:
1 b# U% l" b7 k' z! K# Z• Compatibility with reactive gases, particularly Oxygen and Nitrogen) R* W& e8 M5 `9 s% ^" I. G
• Sufficient ion current density to make dense moisture stable films.  E" o  ^# i9 {+ ]0 H7 U& p, L; E
• Adjustable to allow for control over a wide range of chamber conditions (pumping speed, chamber
  A* y* }6 h2 i& Z! E; M3 psize). Also, some users will want high currents at low voltages (100ev - 200ev) while others will want
# }  Q6 ]% [- chigher energies up to 1000 ev and possibly lower currents.
; e( v7 C; i( P7 ~1 I• Reliability, since the ion sources are primarily used in production systems./ F, c6 b1 s( h* Z9 i( n
• Long cleaning and maintenance cycles with simple ignition and switch-off.
( b4 v2 \- _0 f- X3 NWhen retrofitting an ion source to an existing coating chamber two additional requirements% A2 s% Y. v( c
become important:
* j$ i( ?) }. W/ Q- j• Simple integration of the power supplies into the system controls8 i! h( z0 m% Y, C- A/ m. j
• Compact dimensions, since space is sometimes limited in existing coating chambers.
# E: V) g8 S9 F2 p: x" [8 yDENTON VACUUM, INC. 1259 NORTH CHURCH STREET, MOORESTOWN, NJ 08057 USA (Ph 609-439-9100, Fax 609-439-9111)

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发表于 2010-5-21 23:03:49 | 显示全部楼层
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